Gomez, F. R. and Rodriguez, R. (2021) Silicon Die with Integrated Epoxy for Improved Interface Adhesion. Journal of Engineering Research and Reports, 20 (8). pp. 50-53. ISSN 2582-2926
460-Article Text-772-1-10-20221007.pdf - Published Version
Download (196kB)
Abstract
Breakthroughs and innovations are constantly being developed in electronic packaging industry to address the manufacturing challenges and overcome existing assembly limitations. An augmented design of thin Silicon die is introduced to establish a robust and improved interface adhesion between the die and the die attach material during the die attach process. The wafer preparation flow is also presented. The realization of the augmented die design with integrated epoxy material would ultimately provide a robust connection and would mitigate the die attach related issues such delamination, die cracks and voids.
Item Type: | Article |
---|---|
Subjects: | East India library > Engineering |
Depositing User: | Unnamed user with email support@eastindialibrary.com |
Date Deposited: | 30 Jan 2023 10:31 |
Last Modified: | 01 Jul 2024 13:27 |
URI: | http://info.paperdigitallibrary.com/id/eprint/124 |