Silicon Die with Integrated Epoxy for Improved Interface Adhesion

Gomez, F. R. and Rodriguez, R. (2021) Silicon Die with Integrated Epoxy for Improved Interface Adhesion. Journal of Engineering Research and Reports, 20 (8). pp. 50-53. ISSN 2582-2926

[thumbnail of 460-Article Text-772-1-10-20221007.pdf] Text
460-Article Text-772-1-10-20221007.pdf - Published Version

Download (196kB)

Abstract

Breakthroughs and innovations are constantly being developed in electronic packaging industry to address the manufacturing challenges and overcome existing assembly limitations. An augmented design of thin Silicon die is introduced to establish a robust and improved interface adhesion between the die and the die attach material during the die attach process. The wafer preparation flow is also presented. The realization of the augmented die design with integrated epoxy material would ultimately provide a robust connection and would mitigate the die attach related issues such delamination, die cracks and voids.

Item Type: Article
Subjects: East India library > Engineering
Depositing User: Unnamed user with email support@eastindialibrary.com
Date Deposited: 30 Jan 2023 10:31
Last Modified: 01 Jul 2024 13:27
URI: http://info.paperdigitallibrary.com/id/eprint/124

Actions (login required)

View Item
View Item