Items where Author is "Bartscher, Markus"

Article

Laquai, René and Illemann, Jens and Bartscher, Markus and Neuschaefer-Rube, Ulrich (2023) The metrological structural resolution for dimensional x-ray CT: analysis of the comparability between the CEB and the PBS method. Measurement Science and Technology, 34 (8). 084002. ISSN 0957-0233